Multitest公司日前宣布，其最新的测试插槽产品nanoKelvin被一家国际IDM公司评选为“测试插槽选择奖”（“test socket of choice” ）。Multitest nanoKelvin产品拥有标准系列，同时也可以进行插入电路板设计，适合小的焊盘尺寸，如CSP、QFN、SO和QFP.
Multitest’s latest test socket generation, the nanoKelvin, has been selected as “test socket of choice” for automotive applications on various handler brands by an international IDM.
The Multitest nanoKelvin is available in standard but also in plunge-to-board design – both without any limitations for its Kelvin capability. nanoKel
vin is suitable for small pad sizes such as CSPs, smallest QFN, SO and QFP.
Beside the excellent features and the short lead time of the nanoKelvin the customer’s decision was based on the broad range of test sockets available and the technical expertise of Multitest. Both make Multitest a partner also for future challenges and new developments. In addition, Multitest’s thorough automotive specific know-how i.e. for tri-temp, high current and high voltage test was seen as a valuable asset.
The worldwide direct technical support offered by Multitest eases communication and ensures fast service. This is considered equally important for the engineers during test design and for the test floor managers at the production sites.
With Multitest’s final test experience a smooth transition from test design to high volume production is guaranteed.