Discover s
oftware is an industry-leading, complete solution
for our customers,” added Molan. “
the combination of throughput
and sensitivity has made the NSX the tool-of-choice for high-volume, zero defect
inspection applications like automotive electronics.This market is dominated by European device manufacturers; over 90 percent of those manufacturers rely on Rudolph inspection systems to ensure their quality control.”
Rudolph's Discover in-line def
ect analysis and data management system helps manufacturers use inspection data more effectively to reduce manufacturing costs and accelerate time to market for new products. Discover provides users with many useful features such as wafer display, customizable charts and fast incident alarms.
The NSX Macro Defect Inspection System is a fast, repeatable inspection solution designed for applications in the back end of the semiconductor manufacturing process. Macro defects (defects 0.5 micron and larger) can be created during wafer manufacturing, probing, bumping, dicing, or by general handling, and can have a major impact on the performance and quality of a microelectronic device. The NSX system quickly and accurately detects yield-inhibiting defects, ensuring product quality and providing valuable process information.