Metryx, Limited, a supplier of mass metrology equipment to the semiconductor manufacturing industry, today announced that it will be hosting the first technical seminar focused on the implementation of mass metrology in the production of advanced semiconductor devices. The one-day seminar will be hosted at IMEC’s facilities in Leuven, Belgium, on April 8th, 2008.
The program will feature speakers drawn from leading integrated device manufacturers including Qimonda, ST Microelectronics
and AMD among others. The emphasis of the one-day program will be on the implementation of mass metrology as an in-line, on-product wafer technique for monitoring process changes and excursions, as well as looking at the role of mass metrology in the development of processes for advanced technology nodes.
“The seminar is the first step in maximizing the potential of the technology by providing a platform to share information and experiences from volume production scenarios,” stated Mark Berry, Director of North America and Europe at Metryx. “Mass metrology is a versatile technology that offers real-time, on-product feedback that has become a critical wafer monitoring tool in the manufacturing process. We believe we are scratching the surface in terms of how beneficial mass metrology can be to process monitoring and process development and look forward to updating the semiconductor manufacturing community about current activity.”