FLandERS, NJ (September 17, 2007)—Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in high-performance process control metrology, defect inspection and data analysis for the semiconductor manufacturing industry, announced today that two 300 mm Fabs have installed Rudolph's DMSVision™ fabwide software systems for yield management and control. The two major memory manufacturers are running advanced processes at the 70 nm node, with one moving to 45 nm in 2008. DMSVision p
rovides a central facility for collection, storage and analysis of inspection and metrology data throughout the fab, allowing engineers to quickly detect and correct yield-robbing defects and process excursions. Faster response and more efficient analysis maximizes the yield benefits derived from inspection and metrology investments.
Building on Rudolph’s unique market position in both front- and back-end, DMSVision accommodates a broad range of data sources and offers the most sophisticated global analysis tools of any currently-available yield analysis system. “DMSVision continues to be a building block for advanced and mature fabs to increase productivity,” said Mike Plisinski, vice president and general manager of Rudolph's Data Analysis and Review Business Unit. “When it was introduced some fifteen years ago, it was the first commercially-available yield management system. Now it is being chosen over well-established products by some of the most advanced fabs in the world. This reflects our commitment to the changing needs of the market, our continued investment in the product over its lifetime, as well as a company-wide focus on providing superior yield management solutions for our customers."
DMSVision is a comprehensive yield management system that can accommodate process performance data from any source in the fab. Its intelligent sampling and analysis capabilities improve the effi